Right Angle Dual Ferrous/Non-Ferrous (FNF) Substrate Probe | Scale 1 | Elcometer 456

Elcometer 456 Right Angle Dual Ferrous/Non-Ferrous (FNF) Substrate Probe - Scale 1

Manufacturer: Elcometer

Part #: T456CFNF1R

Description: Don't miss out on this amazing probe! It's a must - have for your measurement needs.

• • Works with All Elcometer 456 Separate Gauges: Compatible with any of our Elcometer 456 Separate Gauges, offering great flexibility.
• • Ideal for Restricted Access: Industrially hardened probe housing allows you to take readings in tight spaces.
• • Automatic Substrate Detection: Saves time and effort with its smart automatic substrate detection feature.

Specifications:

• Range: 0 - 60 mils (0 - 1500µm)
• Accuracy: ±1 - 3% or ±0.1 mil (±2.5µm)
• Resolution: 0.01 mil: 0 - 5 mils; 0.1mil: 5 - 60 mils (0.1µm: 0 - 100µm; 1µm: 100 - 1500µm)
• Minimum convex surface radius 10mm (0.39')
• F Mode: 4mm (0.16')
• N Mode: 26mm (1.02')
• Minimum concave surface radius 12.5mm (0.49')
• Minimum headroom 38mm (1.50')
• Minimum sample diameter 4mm (0.16')
• F Mode: 4mm (0.16')
• N Mode: 6mm (0.24')

Data Sheet

The Elcometer 456 Right Angle Dual Ferrous/Non - Ferrous (FNF) Substrate Probe is perfect for professionals in industries like manufacturing and quality control. It can be used in scenarios where you need to measure coatings on substrates in tight or restricted areas, such as inside machinery or around complex structures. The probe has a range of 0 - 60 mils (0 - 1500µm), with good accuracy (±1 - 3% or ±0.1 mil). It has specific requirements for surface radii and headroom, like a minimum convex surface radius of 10mm and minimum headroom of 38mm. This makes it a reliable tool for getting accurate coating measurements in various situations.